Enrolment options

Fundamentals of crystallography, scattering and diffraction, properties of X-rays and electron beams, X-ray diffraction, crystal structure determinations, intensities of diffracted beam, lattice parameter measurement and phase diagram determinations, electron and neutron diffraction, SEM and TEM, spectroscopy, miscellaneous materials characterization techniques.

Self enrolment (Student)
Self enrolment (Student)